The ESIS-3000 is a device that inspects Edge/Notch/Surface, and the EIS-3000 inspects Edge/Notch, which performs the functions that customers want. The overwhelming difference in technology allows you to detect various Defects on the wafer. through various technological cooperation with domestic companies, we are leading the market in global competition and attracting many customers' satisfaction. If you use this product, you can see various types of Defects that have not been known before.